本港台现场报码室
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Semitronix Tester T4100 is a parallel tester of the 4th generation of Semitronix’s powerful fast parametric tester.  It has the capacity to provide users with consistently accurate high-speed test solutions for rapid process monitoring.

? For electrical measurements in advanced semiconductor wafer manufacturing processes
? Dramatically reduce the test time
? Even faster when combined with Semitronix’s addressable test chip solutions
? Sub-pA level accuracy

MAIN FEATURES

? Provide users with accurate and high-speed solutions for better process monitoring
? Offer two operation modes: online and offline
? Algorithms created in TCL for convenient editing and debugging
? Enable engineers to change the details of test plan based on the results of previous tests
? Provide a convenient method of controlling wafer probers, and specifying test frame execution flow
? Compatible with industry standard wafer probers
MAJOR BENEFITS ? >10X faster than common parametric tester for addressable array testing
? Proven fast measurement solution for addressable test chips
? Parallel testing capability to further reduce test time and lower test cost
? Greatly simplified control of test systems and wafer probers in production environment
? Intelligent software environment


       

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